Dielectric charging induced drift in micro device reliability-a review.

Wu Zhou Jiangbo He Xiao-Ping He Huijun Yu Bei Peng

Published in: Microelectron. Reliab. (2016)

Keyphrases

learning algorithm
literature review
portable devices
concept drift
electric vehicles
reliability analysis
database
real time
information retrieval
artificial intelligence
expert systems
integrated circuit
error detection
highly reliable
error accumulation
gate dielectrics