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Jiangbo He
ORCID
Publication Activity (10 Years)
Years Active: 2016-2023
Publications (10 Years): 4
Top Topics
Open Loop
Error Accumulation
Gate Dielectrics
High Precision
Top Venues
Sensors
IEEE Trans. Instrum. Meas.
Microelectron. Reliab.
NEMS
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Publications
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Longqi Ran
,
Yichuan Wu
,
Jiangbo He
,
Binlei Cao
,
Zongda Hu
,
Wu Zhou
An Improved SOI-on-Glass Fabrication Method of Large-Area Sheeting of MEMS Isolator.
NEMS
(2023)
Jiangbo He
,
Wu Zhou
,
Xiaoping He
,
Huijun Yu
,
Longqi Ran
Drift of MEMS Closed-Loop Accelerometers Induced by Dielectric Charging.
IEEE Trans. Instrum. Meas.
70 (2021)
Jiangbo He
,
Wu Zhou
,
Huijun Yu
,
Xiao-Ping He
,
Peng Peng
Structural Designing of a MEMS Capacitive Accelerometer for Low Temperature Coefficient and High Linearity.
Sensors
18 (2) (2018)
Wu Zhou
,
Jiangbo He
,
Xiao-Ping He
,
Huijun Yu
,
Bei Peng
Dielectric charging induced drift in micro device reliability-a review.
Microelectron. Reliab.
66 (2016)