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Fully Differential 4-V Output Range 14.5-ENOB Stepwise Ramp Stimulus Generator for On-Chip Static Linearity Test of ADCs.
Guillaume Renaud
Mamadou Diallo
Manuel J. Barragan
Salvador Mir
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2019)
Keyphrases
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high speed
wide range
low cost
high density
real time
evolutionary algorithm
statistical significance
analog vlsi
built in self test
rbf network
pseudorandom