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Time-Division Multiplexing for Testing DVFS-Based SoCs.
Fotis Vartziotis
Xrysovalantis Kavousianos
Krishnendu Chakrabarty
Arvind Jain
Rubin A. Parekhji
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2015)
Keyphrases
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information retrieval
test cases
database
data sets
databases
similarity measure
training data
multiscale
learning environment
search algorithm
highly efficient
test suite
test generation