Trend of CMOS downsizing and its reliability.

Hiroshi Iwai S. Ohmi

Published in: Microelectron. Reliab. (2002)

Keyphrases

low cost
power consumption
high speed
circuit design
reliability analysis
artificial intelligence
gate dielectrics
low power
highly reliable
real world
information retrieval
image sequences
expert systems
delay insensitive
vlsi circuits
reliability assessment