Influence of local thermal dissipation on electromigration in an Al thin-film line.
Yuan LiHsin-Tzu LeeMasumi SakaPublished in: Microelectron. Reliab. (2016)
Keyphrases
- thin film
- room temperature
- heat transfer
- short circuit
- high density
- electron microscopy
- infrared
- solar cell
- multi layer
- factors influencing
- liquid crystal displays
- numerical solution
- plasma etching
- energy dissipation
- grain size
- power plant
- line segments
- chance discovery
- genetic algorithm
- lessons learned
- sensor networks