Testability and test generation for majority voting fault-tolerant circuits.
Charles E. StroudAhmed E. BarbourPublished in: J. Electron. Test. (1993)
Keyphrases
- fault tolerant
- majority voting
- test generation
- test data generation
- fault tolerance
- test cases
- software testing
- distributed systems
- knn
- ensemble methods
- classifier ensemble
- quality assurance
- k nearest neighbor
- static analysis
- support vector machine
- load balancing
- ensemble classifier
- test data
- circuit design
- artificial intelligence
- named entity recognition
- neural network
- random forests
- feature selection
- nearest neighbor