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Evaluation of TFET and FinFET devices and 32-Bit CLA circuits considering work function variation and line-edge roughness.

Chien-Ju ChenYin-Nien ChenMing-Long FanVita Pi-Ho HuPin SuChing-Te Chuang
Published in: ISCAS (2015)
Keyphrases
  • mobile devices
  • edge detection
  • multiscale
  • genetic algorithm
  • high speed
  • line segments
  • embedded systems
  • fractal dimension
  • edge information
  • directional information
  • edge strength