Built-In Current Sensor for IDDQ Testing in Deep Submicron CMOS.

Th. Calin Lorena Anghel Michael Nicolaidis

Published in: VTS (1999)

Keyphrases

low power
vlsi circuits
sensor networks
low cost
real time
power consumption
neural network
low voltage
test cases
sensor data
data sets
high speed
multi sensor
statistical tests
image sensor
image processing
analog vlsi