Stuck-at Faults in ReRAM Neuromorphic Circuit Array and their Correction through Machine Learning.
Vedant SawalHiu Yung WongPublished in: CoRR (2024)
Keyphrases
- machine learning
- error detection
- fault diagnosis
- high speed
- machine learning algorithms
- learning algorithm
- machine learning methods
- information extraction
- fault detection
- computer vision
- machine learning approaches
- natural language processing
- learning tasks
- low cost
- circuit design
- artificial neural networks
- pattern recognition
- decision trees
- data sets
- fault model
- analog circuits
- error correction
- learning problems
- semi supervised learning
- text mining
- support vector machine
- data mining