A Multiscale Material Testing System for In Situ Optical and Electron Microscopes and Its Application.

Xuan Ye Zhiguo Cui Huajun Fang Xide Li

Published in: Sensors (2017)

Keyphrases

multiscale
electron beam
laser scanning
image representation
wavelet transform
image segmentation
natural images
test cases
multiscale analysis
image processing
edge detection
scale space
filter bank
real time
test data
coarse to fine
spatial domain