Reaction Force Inspection System using Wavelet Transforms and Neural Networks.
Yasuhiro YamadaYoshiaki KomuraMasanobu MasudaYuuichi OokuboPublished in: ICRA (2002)
Keyphrases
- training process
- neural network
- wavelet transform
- image coding
- high frequency
- multiresolution
- wavelet transformation
- translation invariant
- wavelet coefficients
- wavelet domain
- multi layer
- quality control
- subband
- vision system
- artificial neural networks
- pattern recognition
- visual inspection
- complex wavelet transform
- recurrent neural networks
- multilayer perceptron
- machine vision
- neural network model
- self organizing maps
- image compression
- fuzzy logic
- genetic algorithm