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Inspection-Resistant Memory Architectures.
Jonathan Kaveh Valamehr
Melissa Chase
Seny Kamara
Andrew Putnam
Daniel Shumow
Vinod Vaikuntanathan
Timothy Sherwood
Published in:
IEEE Micro (2013)
Keyphrases
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memory management
memory hierarchy
automatic inspection
memory size
main memory
quality control
memory usage
defect detection
memory space
random access
visual inspection
databases
memory requirements
data structure
decision making
social networks
data mining