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Diagnosis for Reconfigurable Single-Electron Transistor Arrays with a More Generalized Defect Model.
Chia-Cheng Wu
Yi-Hsiang Hu
Chia-Chun Lin
Yung-Chih Chen
Juinn-Dar Huang
Chun-Yao Wang
Published in:
ACM J. Emerg. Technol. Comput. Syst. (2021)
Keyphrases
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computational model
statistical model
formal model
probabilistic model
neural network
theoretical framework
real time
high level
expert systems
prior knowledge
medical images
em algorithm
parameter estimation
infrared
experimental data
prediction model