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Accurate and Fast On-Wafer Test Circuitry Integrated With a 140-dB-Input-Range Current Digitizer for Parameter Tests in WAT.
Long-Yi Lin
Hao-Chiao Hong
Published in:
IEEE Trans. Circuits Syst. I Regul. Pap. (2022)
Keyphrases
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statistical tests
input parameters
test cases
multiple choice
wide range
high quality
neural network
test data
test generation
post hoc
information systems
input data
integrated circuit
massively parallel
semiconductor manufacturing