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Solutions to Multiple Probing Challenges for Test Access to Multi-Die Stacked Integrated Circuits.
Erik Jan Marinissen
Ferenc Fodor
Arnita Podpod
Michele Stucchi
Yu-Rong Jian
Cheng-Wen Wu
Published in:
ITC (2018)
Keyphrases
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integrated circuit
data sets
real world
key issues
multiple users
case study
optimal solution
statistical significance
wireless technologies
test data
lessons learned
solution space
benchmark problems
search capabilities
electron beam
practical solutions