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Reversible dielectric breakdown in h-BN stacks: a statistical study of the switching voltages.

Juan Bautista RoldánDavid MaldonadoFrancisco Jiménez-MolinosChristian AcalJuan Eloy Ruiz-CastroAna M. AguileraFei HuiJ. KongY. ShiXu JingChao WenMarco Antonio VillenaMario Lanza
Published in: IRPS (2020)
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