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Wireless Power Transmission for Non-contact Wafer-Level Testing.

Andrzej RadeckiHayun ChungYoichi YoshidaNoriyuki MiuraTsunaaki ShideiHiroki IshikuroTadahiro Kuroda
Published in: IEICE Trans. Electron. (2012)
Keyphrases
  • power transmission
  • wireless networks
  • wireless communication
  • integrated circuit
  • data streams
  • expert systems
  • evolutionary algorithm
  • simulated annealing
  • test cases
  • semiconductor manufacturing