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Extraction technique for characterization of electric field distribution and drain current in VDMOS power transistor.
N. Kaushik
A. Kranti
Mridula Gupta
R. S. Gupta
Published in:
Microelectron. J. (2003)
Keyphrases
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electric field
space charge
power consumption
high speed
automatic extraction
silicon dioxide
uniformly distributed
low power
probability distribution
genetic algorithm
data center
integrated circuit
spatial distribution
automatically extracting
probabilistic model
external force
real time