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A 0.33 V 2.5 μW cross-point data-aware write structure, read-half-select disturb-free sub-threshold SRAM in 130 nm CMOS.
Wei Jin
Weifeng He
Jian-Fei Jiang
Haichao Huang
Xuejun Zhao
Yanan Sun
Xin Chen
Naifeng Jing
Published in:
Integr. (2017)
Keyphrases
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data sets
data analysis
high quality
data collection
high dimensional data
data structure
data sources
missing data
database
image data
synthetic data
original data
training data
spatial data
data quality
complex structures