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Roving testing using new built-in-self-tester designs for FPGAs.

Vinay VermaShantanu Dutt
Published in: FPGA (2004)
Keyphrases
  • test cases
  • software testing
  • black box
  • testing process
  • test data
  • multiscale
  • hardware implementation
  • real time
  • genetic algorithm
  • feature selection
  • expert systems
  • software engineering
  • low cost
  • design space