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Redefinition of Write Margin for Next-Generation SRAM and Write-Margin Monitoring Circuit.

Koichi TakedaHidetoshi IkedaYasuhiko HagiharaMasahiro NomuraHiroyuki Kobatake
Published in: ISSCC (2006)
Keyphrases
  • support vector
  • real time
  • training set
  • maximum margin
  • machine learning
  • soft margin
  • multi class
  • high speed
  • power consumption
  • decision boundary
  • read write
  • electronic circuits