Industrial defective chips detection using deep convolutional neural network with inverse feature matching mechanism.
Waseem UllahSamee Ullah KhanMin Je KimAltaf HussainMuhammad MunsifMi Young LeeDaeho SeoSung Wook BaikPublished in: J. Comput. Des. Eng. (2024)
Keyphrases
- feature matching
- convolutional neural network
- image pairs
- feature extraction and matching
- feature points
- matching algorithm
- image matching
- object recognition
- matching accuracy
- outlier rejection
- object detection
- image registration
- geometric constraints
- detection algorithm
- feature tracking
- graph matching
- relaxation labeling
- detection method
- image processing
- stereo pair
- wide baseline
- face detection
- structure from motion
- object matching