FEATURE EXTRACTION AND MATCHING
Experts
- Jiayi Ma
- Songlin Du
- Yong Ma
- Xingyu Jiang
- Steven Mills
- Junjun Jiang
- Huabing Zhou
- In-So Kweon
- Yaping Yan
- Xiaoyong Lu
- Qi Tian
- Shuang Chen
- Bin Luo
- Yang Yang
- Ali Shokoufandeh
- Ching Y. Suen
- Bo Jiang
- Zhiyi Huang
- Xiaoxin Tang
- Kai-Cheung Leung
- Yizhang Liu
- David M. Eyers
- Yen-Yu Lin
- Chang-Hwan Son
- Yinguo Li
- Cheng Cheng
- Peifa Jia
- Ce Gao
- Jin Tang
- Q. M. Jonathan Wu
- Sungho Jo
- Kwanghoon Sohn
- Yakov Keselman
- M. Fatih Demirci
- Changcai Yang
- Yixu Song
- Arnak S. Dalalyan
- Xiaoyan Fan
- Xiaoguang Mei
Venues
- CoRR
- IEEE Trans. Geosci. Remote. Sens.
- Pattern Recognit.
- ICIP
- Sensors
- IEEE Access
- CVPR
- Remote. Sens.
- IEEE Geosci. Remote. Sens. Lett.
- ICASSP
- IEEE Trans. Pattern Anal. Mach. Intell.
- ICCV
- IROS
- IEEE Trans. Image Process.
- Multim. Tools Appl.
- ICRA
- SMC
- ICDAR
- J. Electronic Imaging
- CVPR Workshops
- EMBC
- ROBIO
- IVCNZ
- ICPR
- ACM Multimedia
- Pattern Recognit. Lett.
- IEEE Trans. Multim.
- Expert Syst. Appl.
- Mach. Vis. Appl.
- Comput. Vis. Image Underst.
- IEICE Trans. Inf. Syst.
- AAAI
- Comput. Biol. Medicine
- Vis. Comput.
- ICARCV
- Appl. Intell.
- Int. J. Pattern Recognit. Artif. Intell.
- Int. J. Comput. Vis.
- Multim. Syst.
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