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TEA: A Test Generation Algorithm for Designs with Timing Exceptions.

Naixing WangChen WangKun-Han TsaiWu-Tung ChengXijiang LinMark KassabIrith Pomeranz
Published in: ATS (2019)
Keyphrases
  • generation algorithm
  • test data generation
  • support vector
  • databases
  • metadata
  • case study
  • microarray