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Automatic Yield Management System for Semiconductor Production Test.
Huiyuan Cheng
Melanie Po-Leen Ooi
Ye Chow Kuang
Eric Kwang Joo Sim
Bryan Cheah
Serge N. Demidenko
Published in:
DELTA (2011)
Keyphrases
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management system
semiconductor manufacturing
production line
semi automatic
fully automatic
machine learning
decision support system
test data
information retrieval
genetic algorithm
website
multiscale
relational databases
dynamic programming
test cases
statistical tests