Eric Kwang Joo Sim

Publication Activity (10 Years)

Years Active: 2011-2013
Publications (10 Years): 0

Top Topics

Learning Algorithm

Semiconductor Manufacturing

Process Control

Top Venues

Publications

Melanie Po-Leen Ooi, Hong Kuan Sok, Ye Chow Kuang, Huiyuan Cheng, Eric Kwang Joo Sim, Serge N. Demidenko, Chris W. K. Chan
Identifying Systematic Failures on Semiconductor Wafers Using ADCAS. IEEE Des. Test 30 (5) (2013)
Melanie Po-Leen Ooi, Eric Kwang Joo Sim, Ye Chow Kuang, Serge N. Demidenko, Lindsay Kleeman, Chris W. K. Chan
Getting More From the Semiconductor Test: Data Mining With Defect-Cluster Extraction. IEEE Trans. Instrum. Meas. 60 (10) (2011)
Huiyuan Cheng, Melanie Po-Leen Ooi, Ye Chow Kuang, Eric Kwang Joo Sim, Bryan Cheah, Serge N. Demidenko
Automatic Yield Management System for Semiconductor Production Test. DELTA (2011)