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Getting More From the Semiconductor Test: Data Mining With Defect-Cluster Extraction.
Melanie Po-Leen Ooi
Eric Kwang Joo Sim
Ye Chow Kuang
Serge N. Demidenko
Lindsay Kleeman
Chris W. K. Chan
Published in:
IEEE Trans. Instrum. Meas. (2011)
Keyphrases
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test data
training data
test cases
test set
data sets
text mining
clustering algorithm
information extraction
data mining
training set
data points
database
evolutionary algorithm
knowledge discovery
supervised learning
error rate
image processing