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An Exact approach for Complete Test Set Generation of Toffoli-Fredkin-Peres based Reversible Circuits.

A. N. NagamaniS. AshwinB. AbhishekVinod Kumar Agrawal
Published in: J. Electron. Test. (2016)
Keyphrases
  • test set
  • training set
  • error rate
  • training data
  • cellular automata
  • test data
  • test cases
  • evaluation methodology
  • class distribution
  • high speed
  • markov chain
  • object recognition
  • multi class
  • training samples