Diagonal Symmetric Pattern Based Illumination Invariant Measure for Severe Illumination Variations.
Changhui HuMengjun YeYang ZhangXiaobo LuPublished in: PRCV (2) (2020)
Keyphrases
- illumination invariant
- illumination variations
- face recognition
- face images
- local binary pattern
- object tracking
- multi band
- gabor features
- illumination conditions
- similarity measure
- image matching
- principal component analysis
- feature extraction
- human faces
- computer vision
- face tracking
- face detection
- viewpoint
- lighting conditions
- partial occlusion
- sparse representation
- natural images
- dimensionality reduction