FACE TRACKING
Experts
- Stan Z. Li
- Rama Chellappa
- Daijin Kim
- Prashant G. Mehta
- Wen Gao
- Yoshitaka Shibata
- Zhen Lei
- Thomas S. Huang
- Maja Pantic
- Luc Van Gool
- Koji Hashimoto
- Vijayan K. Asari
- Bogdan Kwolek
- Mohan M. Trivedi
- Juan José Pantrigo
- Josef Kittler
- Henry Medeiros
- Fadi Dornaika
- Xilin Chen
- Kazuhiko Terashima
- Brian C. Lovell
- Franck Davoine
- Vishal M. Patel
- Qiang Ji
- Anil K. Jain
- Yaser Sheikh
- Shiguang Shan
- Thomas B. Moeslund
- Norikazu Ikoma
- Yosuke Sato
- Shaogang Gong
- Junjie Yan
- Antonio S. Montemayor
- Guangyou Xu
- Shin'ichi Satoh
- Maurizio Omologo
- Marco Matassoni
- Takanori Miyoshi
- Chen Change Loy
Venues
- CoRR
- ICIP
- ICASSP
- ICRA
- IROS
- Sensors
- FUSION
- FG
- ICPR
- IEEE Access
- CVPR
- CVPR Workshops
- Multim. Tools Appl.
- EUSIPCO
- SMC
- ICCV
- Pattern Recognit.
- Image Vis. Comput.
- BMVC
- ICME
- Pattern Recognit. Lett.
- WACV
- ROBIO
- Neurocomputing
- Comput. Vis. Image Underst.
- AVSS
- IEEE Trans. Pattern Anal. Mach. Intell.
- MVA
- ACC
- IEEE Trans. Image Process.
- ACM Multimedia
- ICIP (3)
- NeuroImage
- IEEE Signal Process. Lett.
- CHI Extended Abstracts
- IEEE Trans. Instrum. Meas.
- Int. J. Comput. Vis.
- FGR
- ICCV Workshops
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