FACE TRACKING
Experts
- Stan Z. Li
- Rama Chellappa
- Daijin Kim
- Yoshitaka Shibata
- Prashant G. Mehta
- Wen Gao
- Thomas S. Huang
- Zhen Lei
- Maja Pantic
- Koji Hashimoto
- Luc Van Gool
- Vijayan K. Asari
- Bogdan Kwolek
- Franck Davoine
- Josef Kittler
- Kazuhiko Terashima
- Brian C. Lovell
- Fadi Dornaika
- Qiang Ji
- Xilin Chen
- Vishal M. Patel
- Mohan M. Trivedi
- Juan José Pantrigo
- Henry Medeiros
- Shaogang Gong
- Yaser Sheikh
- Norikazu Ikoma
- Antonio S. Montemayor
- Guangyou Xu
- Anil K. Jain
- Thomas B. Moeslund
- Maurizio Omologo
- Junjie Yan
- Shin'ichi Satoh
- Shiguang Shan
- Yosuke Sato
- Hajime Asama
- Richa Singh
- Jean-Luc Dugelay
Venues
- CoRR
- ICIP
- ICASSP
- IROS
- ICRA
- Sensors
- FUSION
- FG
- ICPR
- CVPR
- IEEE Access
- CVPR Workshops
- Multim. Tools Appl.
- EUSIPCO
- SMC
- ICCV
- Pattern Recognit.
- Image Vis. Comput.
- BMVC
- ICME
- Pattern Recognit. Lett.
- WACV
- ROBIO
- Neurocomputing
- Comput. Vis. Image Underst.
- IEEE Trans. Pattern Anal. Mach. Intell.
- AVSS
- ACC
- IEEE Trans. Image Process.
- MVA
- ACM Multimedia
- NeuroImage
- ICIP (3)
- IEEE Trans. Instrum. Meas.
- CHI Extended Abstracts
- IEEE Signal Process. Lett.
- FGR
- CRV
- Int. J. Comput. Vis.
Related Topics
Related Keywords
Popularity
No popularities found. Try to change the filters.
Popularity Trend