A self optimizing autofocusing scheme for microscope integrated visual inspection systems.
Eray A. BaranOrhan AyitVictor B. SantiagoSergio Lopez-DorigaAsif SabanovicPublished in: IECON (2013)
Keyphrases
- visual inspection
- laser scanning
- image analysis
- management system
- data mining
- computer systems
- multimedia
- building blocks
- complex systems
- real time
- information retrieval
- artificial intelligence
- computer vision
- face recognition
- database
- learning systems
- retrieval systems
- computing systems
- neural network
- registration accuracy