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Characterization of Resistance-Switching of Si Oxide Dielectrics Prepared by RF Sputtering.
Akio Ohta
Yuta Goto
Shingo Nishigaki
Guobin Wei
Hideki Murakami
Seiichiro Higashi
Seiichi Miyazaki
Published in:
IEICE Trans. Electron. (2012)
Keyphrases
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metal oxide
si sio
x ray
solid state
high speed
rf sputtering
neural network
database
databases
data mining
artificial intelligence
three dimensional
evolutionary algorithm
leakage current