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Characterization of Resistance-Switching of Si Oxide Dielectrics Prepared by RF Sputtering.

Akio OhtaYuta GotoShingo NishigakiGuobin WeiHideki MurakamiSeiichiro HigashiSeiichi Miyazaki
Published in: IEICE Trans. Electron. (2012)
Keyphrases
  • metal oxide
  • si sio
  • x ray
  • solid state
  • high speed
  • rf sputtering
  • neural network
  • database
  • databases
  • data mining
  • artificial intelligence
  • three dimensional
  • evolutionary algorithm
  • leakage current