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Combining deterministic logic BIST with test point insertion.

Harald P. E. VrankenFlorian MeisterHans-Joachim Wunderlich
Published in: ETW (2002)
Keyphrases
  • built in self test
  • integrated circuit
  • modal logic
  • multi valued
  • classical logic
  • databases
  • neural network
  • artificial intelligence
  • test cases
  • test data
  • black box
  • software testing
  • defeasible logic
  • truth values