Testing techniques for resistive-open defects in future CMOS technologies.
Mohammad FawazNader KobrosliAli ChehabAyman I. KayssiPublished in: APCCAS (2010)
Keyphrases
- current status
- low cost
- open systems
- neural network
- advanced technologies
- future development
- long term
- high speed
- low power
- future trends
- software testing
- real time
- test cases
- artificial intelligence
- real world
- st century
- test set
- information systems
- paradigm shift
- defect detection
- data mining
- software development life cycle
- defect classification