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Deep Discriminative Feature Learning and Feature Space Transformation for Scalable Machine Fault Diagnosis.
K. T. Sreekumar
C. Santhosh Kumar
K. I. Ramachandran
Published in:
IEEE Access (2024)
Keyphrases
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fault diagnosis
feature space
learning algorithm
analog circuits
neural network
supervised learning
rotating machinery
expert systems
learning tasks
fault detection
operating conditions
fault detection and diagnosis
electronic equipment