Detecting Fault Modules Applying Feature Selection to Classifiers.
Daniel RodríguezRoberto RuizJuan Jose Cuadrado-GallegoJesús S. Aguilar-RuizPublished in: IRI (2007)
Keyphrases
- feature selection
- support vector
- feature set
- feature subset
- small sample
- naive bayes
- feature selection algorithms
- classification models
- bayes classifier
- text categorization
- fault diagnosis
- training data
- feature ranking
- fault detection
- high dimensionality
- classification accuracy
- accurate classification
- information gain
- meta learning
- classification performances
- mutual information
- support vector machine
- feature extraction
- model selection
- feature selection and classifier
- optimal subset of features
- bayesian classifier
- multi class
- training set
- microarray data
- knn
- text classification
- feature space
- selected features
- irrelevant features
- linear discriminant
- text classifiers
- high dimensional
- input features
- machine learning
- svm classifier
- machine learning algorithms
- unsupervised learning