FEATURE SELECTION AND CLASSIFIER
Experts
- Mineichi Kudo
- Yaxin Bi
- David A. Bell
- Gongde Guo
- Yiming Yang
- Naoto Abe
- Hui Wang
- José Ranilla
- Jun Toyama
- Tien Thanh Nguyen
- Elena Montañés
- Sriparna Saha
- Asif Ekbal
- Masaru Shimbo
- ElÃas F. Combarro
- Irene DÃaz
- Songbo Tan
- Alan Wee-Chung Liew
- Raymel Alfonso Sallo
- Yizheng Chen
- Ammar Zakaria
- Meryeme Hadni
- Ali Yeon Md Shakaff
- William T. Freeman
- Yang Ning
- Michael P. Oakes
- Abdallah Khreishah
- Minsu Cho
- Guoyang Chen
- Kivilcim Sungur-Stasik
- Ping Zhang
- Michael C. Lee
- Mohammed Ghaith Altarabichi
- Allan Melvin Andrew
- Dongdong She
- Jiwen Guan
- Elad Hoffer
- Jinwoo Shin
- Chunpeng Wu
Venues
- CoRR
- Expert Syst. Appl.
- SIGIR
- SSPR/SPR
- ICML
- IEEE Access
- SMC
- IEEE Congress on Evolutionary Computation
- CICLing
- Appl. Soft Comput.
- Soft Comput.
- Pattern Recognit.
- ISNN (2)
- IEA/AIE
- J. Assoc. Inf. Sci. Technol.
- Sensors
- FSKD
- Comput. Informatics
- Comput. Biol. Medicine
- WWW
- Pattern Recognit. Lett.
- CEC
- AAAI
- ICDM
- AINA Workshops
- IJCNN
- DMIN
- IEEE Trans. Knowl. Data Eng.
- SAC
- Inf. Process. Manag.
- MLMTA
- ICPR
- Int. J. Comput. Intell. Appl.
- GECCO
- CVPR (1)
- Reliab. Eng. Syst. Saf.
- TREC
- IJCCI (ECTA-FCTA)
- IEEE Trans. Neural Networks Learn. Syst.
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