Cluster-based detection of SEU-caused errors in LUTs of SRAM-based FPGAs.
E. Syam Sundar ReddyVikram ChandrasekharMilagros SashikánthV. KamakotiNarayanan VijaykrishnanPublished in: ASP-DAC (2005)
Keyphrases
- detection algorithm
- detection method
- automatic detection
- object detection
- power consumption
- false alarms
- detection accuracy
- anomaly detection
- false positives
- image processing algorithms
- detection rate
- error detection
- detection scheme
- field programmable gate array
- efficient implementation
- learning algorithm
- change detection
- image processing