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Measurement of Photo Capacitance in Amorphous Silicon Photodiodes.

Dora GonçalvesMiguel FernandesPaula LouroManuela VieiraAlessandro Fantoni
Published in: DoCEIS (2013)
Keyphrases
  • high speed
  • low cost
  • data acquisition
  • low power
  • real time
  • thin film
  • database
  • high frequency
  • high density
  • measurement error
  • data sets
  • multiresolution
  • measurement data
  • chemical vapor deposition
  • plasma etching