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Gate Oxide Reliability Studies of Commercial 1.2 kV 4H-SiC Power MOSFETs.
Tianshi Liu
Shengnan Zhu
Susanna Yu
Diang Xing
Arash Salemi
Minseok Kang
Kristen Booth
Marvin H. White
Anant K. Agarwal
Published in:
IRPS (2020)
Keyphrases
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leakage current
low voltage
power consumption
silicon dioxide
electrical power
power management
power system
field effect transistors
power distribution systems
data sets
multiple input
reliability analysis
highly reliable
transmission line
empirical studies
x ray
database systems