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Improving test effectiveness of scan-based BIST by scan chain partitioning.

Dong XiangMing-Jing ChenJia-Guang SunHideo Fujiwara
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2005)
Keyphrases
  • scan data
  • knowledge base
  • machine learning
  • connected components
  • connected component labeling
  • real time
  • data sets
  • real world
  • feature space
  • test cases
  • scan path
  • conducted an empirical study
  • built in self test