CONNECTED COMPONENT LABELING
Experts
- Lifeng He
- Yuyan Chao
- Costantino Grana
- Lionel Lacassagne
- Federico Bolelli
- Kenji Suzuki
- Bin Yao
- Xiao Zhao
- Stefano Allegretti
- Laurent Cabaret
- Michele Cancilla
- Prabir Bhattacharya
- Loukas Georgiadis
- Giuseppe F. Italiano
- Lorenzo Baraldi
- Péter Balázs
- Dan Schonfeld
- Tetsuo Asano
- Daniel Etiemble
- Wei Lu
- Marcin Kowalczyk
- Florian Lemaitre
- Rita Cucchiara
- Yang Wang
- Marie-Françoise Roy
- Robert E. Tarjan
- Tomasz Kryjak
- Alok N. Choudhary
- Daniele Borghesani
- Evangelos Kosinas
- Oded Green
- Kuo-Chin Fan
- Binhai Zhu
- Vibhor Rastogi
- Ronald Lumia
- Weiping Shi
- Daniel Gracia Pérez
- Keisuke Nonaka
- Douglas B. West
Venues
- CoRR
- Pattern Recognit.
- IEEE Trans. Image Process.
- ICIP
- ICPR
- ICASSP
- Image Vis. Comput.
- Inf. Process. Lett.
- Pattern Recognit. Lett.
- J. Math. Imaging Vis.
- ISCAS
- Comput. Vis. Image Underst.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Systems and Computers in Japan
- Comput. Vis. Graph. Image Process.
- J. Parallel Distributed Comput.
- CAIP
- Electron. Notes Discret. Math.
- J. Real Time Image Process.
- Inf. Sci.
- SIAM J. Comput.
- ICPR (2)
- J. Vis. Commun. Image Represent.
- Multim. Tools Appl.
- ESA
- SIGARCH Comput. Archit. News
- Discret. Math.
- SIAM J. Discret. Math.
- Comput. J.
- SPAA
- Commun. ACM
- IEEE Access
- IEICE Trans. Inf. Syst.
- IEEE Trans. Parallel Distributed Syst.
- Electron. J. Comb.
- DGCI
- IPDPS
- ICIAP Workshops
- Int. J. Pattern Recognit. Artif. Intell.
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