CONNECTED COMPONENT LABELING
Experts
- Yuyan Chao
- Lifeng He
- Costantino Grana
- Lionel Lacassagne
- Federico Bolelli
- Kenji Suzuki
- Xiao Zhao
- Stefano Allegretti
- Bin Yao
- Laurent Cabaret
- Michele Cancilla
- Loukas Georgiadis
- Giuseppe F. Italiano
- Lorenzo Baraldi
- Prabir Bhattacharya
- Dan Schonfeld
- Péter Balázs
- Tetsuo Asano
- Daniel Etiemble
- Marie-Françoise Roy
- Rita Cucchiara
- Florian Lemaitre
- Daniele Borghesani
- Kuo-Chin Fan
- Binhai Zhu
- Yang Wang
- Robert E. Tarjan
- Alok N. Choudhary
- Evangelos Kosinas
- Oded Green
- Marcin Kowalczyk
- Tomasz Kryjak
- Wei Lu
- Keisuke Nonaka
- Saugata Basu
- Jaekyu Ha
- David A. Bader
- Phalguni Gupta
- Sei Naito
Venues
- CoRR
- Pattern Recognit.
- IEEE Trans. Image Process.
- ICIP
- ICPR
- ICASSP
- Image Vis. Comput.
- Inf. Process. Lett.
- Pattern Recognit. Lett.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ISCAS
- Systems and Computers in Japan
- Comput. Vis. Image Underst.
- J. Math. Imaging Vis.
- CAIP
- Comput. Vis. Graph. Image Process.
- J. Real Time Image Process.
- J. Parallel Distributed Comput.
- Electron. Notes Discret. Math.
- SIGARCH Comput. Archit. News
- Inf. Sci.
- J. Vis. Commun. Image Represent.
- Multim. Tools Appl.
- SIAM J. Comput.
- ICPR (2)
- ESA
- SIAM J. Discret. Math.
- Comput. J.
- IEEE Access
- IEEE Trans. Parallel Distributed Syst.
- SPAA
- IEICE Trans. Inf. Syst.
- Discret. Math.
- Commun. ACM
- Networks
- Parallel Algorithms
- IPDPS
- Document Recognition
- DGCI
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