CONNECTED COMPONENT LABELING
Experts
- Lifeng He
- Yuyan Chao
- Costantino Grana
- Lionel Lacassagne
- Kenji Suzuki
- Federico Bolelli
- Xiao Zhao
- Stefano Allegretti
- Bin Yao
- Michele Cancilla
- Laurent Cabaret
- Loukas Georgiadis
- Lorenzo Baraldi
- Prabir Bhattacharya
- Giuseppe F. Italiano
- Péter Balázs
- Dan Schonfeld
- Tetsuo Asano
- Daniel Etiemble
- Alok N. Choudhary
- Kuo-Chin Fan
- Marcin Kowalczyk
- Binhai Zhu
- Florian Lemaitre
- Marie-Françoise Roy
- Oded Green
- Robert E. Tarjan
- Rita Cucchiara
- Wei Lu
- Evangelos Kosinas
- Daniele Borghesani
- Tomasz Kryjak
- Yang Wang
- Houari Sabirin
- Phalguni Gupta
- Jaekyu Ha
- Michael Beetz
- Xiaofan Yang
- Weiping Shi
Venues
- CoRR
- Pattern Recognit.
- IEEE Trans. Image Process.
- ICPR
- ICIP
- ICASSP
- Inf. Process. Lett.
- Pattern Recognit. Lett.
- Image Vis. Comput.
- Comput. Vis. Image Underst.
- ISCAS
- J. Math. Imaging Vis.
- Systems and Computers in Japan
- IEEE Trans. Pattern Anal. Mach. Intell.
- CAIP
- J. Real Time Image Process.
- Electron. Notes Discret. Math.
- J. Parallel Distributed Comput.
- Comput. Vis. Graph. Image Process.
- SIGARCH Comput. Archit. News
- SIAM J. Comput.
- ICPR (2)
- Inf. Sci.
- J. Vis. Commun. Image Represent.
- ESA
- Multim. Tools Appl.
- IEEE Trans. Parallel Distributed Syst.
- IEICE Trans. Inf. Syst.
- SIAM J. Discret. Math.
- IEEE Access
- Commun. ACM
- Comput. J.
- SPAA
- Discret. Math.
- J. ACM
- Document Recognition
- Int. J. Comput. Math.
- FPL
- DGCI
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