CONNECTED COMPONENT LABELING
Experts
- Yuyan Chao
- Lifeng He
- Costantino Grana
- Lionel Lacassagne
- Federico Bolelli
- Kenji Suzuki
- Xiao Zhao
- Bin Yao
- Stefano Allegretti
- Laurent Cabaret
- Michele Cancilla
- Prabir Bhattacharya
- Loukas Georgiadis
- Lorenzo Baraldi
- Giuseppe F. Italiano
- Daniel Etiemble
- Tetsuo Asano
- Péter Balázs
- Dan Schonfeld
- Binhai Zhu
- Wei Lu
- Alok N. Choudhary
- Florian Lemaitre
- Marcin Kowalczyk
- Oded Green
- Marie-Françoise Roy
- Evangelos Kosinas
- Tomasz Kryjak
- Rita Cucchiara
- Daniele Borghesani
- Yang Wang
- Robert E. Tarjan
- Kuo-Chin Fan
- Yun Yang
- Douglas B. West
- Chin-Chen Chang
- Sei Naito
- Jaekyu Ha
- Graham M. Megson
Venues
- CoRR
- Pattern Recognit.
- IEEE Trans. Image Process.
- ICPR
- ICIP
- ICASSP
- Pattern Recognit. Lett.
- Inf. Process. Lett.
- Image Vis. Comput.
- Comput. Vis. Image Underst.
- J. Math. Imaging Vis.
- IEEE Trans. Pattern Anal. Mach. Intell.
- ISCAS
- Systems and Computers in Japan
- J. Real Time Image Process.
- J. Parallel Distributed Comput.
- Electron. Notes Discret. Math.
- CAIP
- Comput. Vis. Graph. Image Process.
- ICPR (2)
- SIGARCH Comput. Archit. News
- Inf. Sci.
- ESA
- J. Vis. Commun. Image Represent.
- Multim. Tools Appl.
- SIAM J. Comput.
- Commun. ACM
- IEEE Trans. Parallel Distributed Syst.
- IEICE Trans. Inf. Syst.
- Comput. J.
- SIAM J. Discret. Math.
- Discret. Math.
- IEEE Access
- COMPCON
- CVGIP Graph. Model. Image Process.
- IPDPS
- ACIVS
- ISVLSI
- Computing
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