A Bayesian image analysis framework for post placement quality inspection of components.
Michael E. ZervakisStefanos GoumasGeorge A. RovithakisPublished in: ICIP (2) (2002)
Keyphrases
- image analysis
- conceptual framework
- computer vision
- pattern recognition
- data driven
- main contribution
- data quality
- multiscale
- image sequences
- multispectral
- theoretical framework
- remote sensing
- visual inspection
- image understanding
- quality control
- higher quality
- machine learning
- semi supervised
- probability distribution
- bayesian networks
- high quality
- image segmentation
- case study
- website
- image processing
- decision making
- artificial intelligence
- genetic algorithm