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Prediction and verification of process induced warpage of electronic packages.
W. D. van Driel
G. Q. Zhang
J. H. J. Janssen
Leo J. Ernst
Fei Su
Kerm Sin Chian
Sung Yi
Published in:
Microelectron. Reliab. (2003)
Keyphrases
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prediction accuracy
case study
real time
multiscale
search algorithm
evolutionary algorithm
process model
development process