films.

Jian Chen Jianbin Xu K. Xue J. An Ning Ke W. Cao H. B. Xia J. Shi D. C. Tian

Published in: Microelectron. Reliab. (2005)

Keyphrases

grain size
electron micrographs
feature selection
database
databases
artificial intelligence
similarity measure
ni fe
real time
neural network
multiresolution
chemical vapor deposition
film restoration
silicon dioxide
permalloy films