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Stuck-Open Fault Detectabilities of Various TPG Circuits for Use in Two-Pattern Testing.
Kiyoshi Furuya
Susumu Yamazaki
Masayuki Sato
Published in:
IEICE Trans. Inf. Syst. (1995)
Keyphrases
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fault model
fault diagnosis
pattern matching
fault models
pattern discovery
fault detection
analog circuits
logic circuits
neural network
multiscale
fault injection
real time
web services
data streams
software testing
vlsi circuits