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Test cost reduction for logic circuits: Reduction of test data volume and test application time.

Yoshinobu HigamiSeiji KajiharaHideyuki IchiharaYuzo Takamatsu
Published in: Systems and Computers in Japan (2005)
Keyphrases
  • test data
  • test cases
  • test set
  • cost reduction
  • training data
  • training set
  • image processing
  • low power
  • logic circuits
  • data sets
  • machine learning
  • error rate
  • software testing
  • search based testing