Login / Signup

Test Data Reduction for BIST-Aided Scan Test Using Compatible Flip-Flops and Shifting Inverter Code.

Masashi IshikawaHiroyuki YotsuyanagiMasaki Hashizume
Published in: Asian Test Symposium (2010)
Keyphrases
  • test data
  • test cases
  • training data
  • test set
  • data sets
  • flip flops
  • source code
  • training set
  • control algorithm
  • testing process
  • databases
  • image processing
  • signal processing