Mapping and Repairing Embedded-Memory Defects.
Lynn YoungsSiva ParamanandamPublished in: IEEE Des. Test Comput. (1997)
Keyphrases
- embedded systems
- memory requirements
- memory space
- defect classification
- memory size
- defect detection
- limited memory
- database
- computing power
- watermarking algorithm
- surface defects
- automated visual inspection
- memory footprint
- computational power
- artificial neural networks
- decision trees
- artificial intelligence
- information retrieval
- machine learning
- databases